Accomplished senior scientist in the optical and material science fields with expertise in new product development. More than 10 years of technical and R&D project management experience.
AREAS OF EXPERTISE
• Product development • Electrical Engineering • Photovoltaic
• Project management • Applied Physics • Material Characterization
• Stage Gate management
• Statistics Minitab, JMP • Material Science
• Optoelectronics • Removable Energy
• Building Science
Professional Experience
Research Associate Saint-Gobain 2007- 2013
Manager responsible for the computer tomography, the optical metrology and surface science department providing R&D and product development services to all business units within the company. I also supported the growth, quality control and testing of Saint-Gobain’s line of photonics and scintillation products for energy, medical, military and homeland security applications. I coordinated and oversaw R&D efforts to improve SG’s line of products. I interfaced and collaborated with the R&D efforts in USA, UK and France. My position also was responsible for the verification of product specifications to ensure customer satisfaction. I participated in both commercial efforts and government contracts (ITAR). I was also involved in the fostering of external collaborations (MIT, UConn, Stony Brook) to pursue commercial and R&D projects. A few of the milestones that we accomplished are:
• Led development of novel technique to measure water vapor transmission rate of high barrier films using laser sensor. Equipment built and used for product development in photovoltaic and organic light emitting diodes (OLEDs) applications. Resulted in measurement threshold of < 10-4g/m2/d; lower than any existing commercial devices.
• Technical member of the team that supported the growth and quality control of a line of photonics and scintillation products of around $100 million in annual revenue.
• Developed and managed the optical metrology, photovoltaic and spectroscopy facilities, providing expertise and support to R&D and quality control of multiple internal business units.
• The development of a spectroscopic method to sense residual stress in large sapphire ribbons for infrared electro- optical applications
• Group leader responsible for the development of metrology solutions critical for process development of a sapphire substrate project with projected sales of $30 million in annual revenue.
• Supported the launch of a line of photovoltaic encapsulant and front sheet materials products.
Optical Engineer (2 years under contract,) L3 Communications/ WPAFB/ UD 2005 –2007
• Delivered the first 1024 x 1024 pixel fully polarimetric camera to the Department of the Air
Force with an extinction ratio of more than 1000. The system included the integration of a
metal grid polarizer with mid-infrared detection materials enabling the production of
polarized images with full definition of the Stokes polarization vectors. This system produces
IR images with higher resolution.
• The fabrication of pixilated high performance mid-infrared filters to be integrated into InSB
based infrared cameras..
Electrical Engineer Nestle, Dominican Republic. 1996–1998
• Designed electric installations for Nestle, Dominican Republic. Supervised 7 technicians.
• Project manager in charge of procuring, installing and maintaining electrical plant and
refrigeration systems. Responsible for oversight of external contractors.
Graduate Assistant Universidad Nacional Pedro Henriquez Urena 1996- 1998
• Taught statistical process control to industrial engineering students
• Consultant providing solution of production and quality control problems.
Research Experience
Research Assistant (Doctoral) University of Dayton 2001-2006
Two Dimensional Distributed Feedback Lasers (DFB). Research advisor: Dr. Andrew Sarangan.
• Experimental development of 1-D and 2-D distributed feedback laser based on
conjugated polymer [2-methoxy-5-(2’-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV)
using interferometric lithography, in both edge and surface emission configuration.
• Theoretical analysis of 1-D surface emission DFB lasers using couple mode theory. Correction
of the couple equations by including the effects of radiation modes. Threshold gain analysis.
Influence of resonator design and Bragg diffraction process on the device performance of
2-D DFBL. Instabilities analysis.
Research Assistant (Master) University of Puerto Rico 1998-2001
Optical Properties of Europium (III+) Doped Porous Silicon. Research advisor: Dr. Huimin Liu.
• Optical characterization of europium (III+) doped porous silicon thin films prepared using
sputtering deposition. The possibility of using silicon as an emitter in the red spectrum was
studied.
• Photoluminescence studies of visible and near-infrared spectroscopic properties of porous
silicon as candidate for lighting application. Quantum efficiency, low temperature photophysics and time resolved spectroscopy was employed to study the material suitability as an emitter.
• Degenerated Four Wave Mixing (DFWM) was used to study fast relaxation process and
energy transfer between the porous silicon nanoclusters and the europium ions.
Education
• MBA, University of Massachusetts Amherst, expected graduation spring 2015.
• Ph.D. Electro-Optics, University of Dayton, Dayton, OH, 2006
• M.S. Physics Laser Spectroscopy, University of Puerto Rico, Mayaguez PR, 2001
• Postgraduate Industrial Engineering Degree, UCMM, Dominican Republic, 1998.
• B.S. Electrical Engineering, UNPHU, Dominican Republic, 1995.
Technical Skills
Micro and Nanofabrication
• Optical Lithography
- DUV Laser Interferometric Lithography for patterning 1-D and 2-D periodic structure
with a maximum resolution of 150 nm.
- Suss Microtech MA/BA6 mask aligner.
- DUV (193nm) ASML 5500/950B lithography Stepper.
• E-beam lithography (Raith 150 system).
• Inductively Coupled Plasma (ICP) etching.
• Plasma-Enhanced Chemical Vapor Deposition (PECVD).
• Thermal Evaporation Deposition.
• RF Magnetron Sputtering.
Optical/Electron microscopy and non-destructive analyses
• Bright and dark field microscopy, differential interference contrast (DIC) and phase contrast.
• Confocal and fluorescence microscopy.
• Scanning Electron Microscope (SEM).
• Energy Dispersive Spectroscopy (EDS).
• X-ray Diffra...
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